X-RAY DIFFRACTION
Starting Model(s)
| Initial Refinement Model(s) | |||
|---|---|---|---|
| Type | Source | Accession Code | Details | 
| experimental model | PDB | 1P0B | pdb entry 1P0B | 
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details | 
| 1 | VAPOR DIFFUSION, HANGING DROP | 5.5 | 291 | pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 291K | 
| Crystal Properties | |
|---|---|
| Matthews coefficient | Solvent content | 
| 2.41 | 49.01 | 
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) | 
| a = 90.757 | α = 90 | 
| b = 65.175 | β = 96.12 | 
| c = 70.455 | γ = 90 | 
| Symmetry | |
|---|---|
| Space Group | C 1 2 1 | 
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 113 | IMAGE PLATE | RIGAKU RAXIS IV++ | 2006-08-01 | M | SINGLE WAVELENGTH | ||||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
| 1 | ROTATING ANODE | RIGAKU | 1.54178 | ||
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | R Sym I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | |||||||
| 1 | 1.7 | 20 | 0.983 | 0.059 | 0.059 | 12 | 2.8 | 40368 | |||||||||||
| Highest Resolution Shell | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | R-Sym I (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | ||||||||||
| 1 | 1.7 | 1.73 | 0.969 | 0.491 | 0.491 | 2.2 | |||||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | ||||
| X-RAY DIFFRACTION | AB INITIO | FREE R | pdb entry 1P0B | 1.7 | 10 | 40368 | 90 | 0.2006 | 0.2006 | 0.2 | 0.2451 | 0.24 | RANDOM | ||||||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| Coordinate Error | ||
|---|---|---|
| Structure Solution Method | Refinement High Resolution | Refinement Low Resolution | 
| 2 | 2812 | 3151 | 
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation | 
| s_similar_adp_cmpnt | 0.077 | 
| s_non_zero_chiral_vol | 0.043 | 
| s_zero_chiral_vol | 0.042 | 
| s_angle_d | 0.026 | 
| s_from_restr_planes | 0.025 | 
| s_anti_bump_dis_restr | 0.013 | 
| s_bond_d | 0.007 | 
| s_similar_dist | |
| s_rigid_bond_adp_cmpnt | |
| s_approx_iso_adps | |
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number | 
| Protein Atoms | 2798 | 
| Nucleic Acid Atoms | |
| Solvent Atoms | 228 | 
| Heterogen Atoms | 50 | 
Software
| Software | |
|---|---|
| Software Name | Purpose | 
| SHELX | model building | 
| SHELXL-97 | refinement | 
| HKL-3000 | data reduction | 
| HKL-2000 | data scaling | 
| SHELX | phasing | 














